Ручные и измерительные инструменты Hoffmann Group 2026 - страница 281

GBP 57 ​ MarSurf CD 140 A contour measuring station The MarSurf CD 140 A has a touch probe system with a measurement range of up to 70 mm, and the probe tips can be changed quickly and without the need for any tools – all without recalibration. Application: The computer-aided measuring station permits comprehensive and quick evaluation of the measurement results: ■ Comprehensive contour measurement functions, fast and simple ■ Probe tips can be changed without the need for tools ■ Traversing velocity in X axis of up to 200 mm/s ■ Simple creation of programs or individual measurements with MarWin ■ Automatic evaluation, best contour fit, CAD contour comparison and many more. ■ Can optionally be expanded with roughness measurement feature (Rz > 2 µm) ■ Measurements with double probe tip are possible 49 9299 – ■ Flexible mounting plate with 25 mm hole grid, no additional X/Y table required 49 9301 – ■ Quick adjustment of the Z axis with easy-to-use handle ■ Flexible mounting plate with 50 mm hole grid, e.g. for KMG workpiece holders Supplied with: Contour measuring machine, machine base incl. Y adjustment, PG A 36-350-25 contact element, MarWin EasyContour plus mobile software, contour calibration standard with 2 balls (45 mm and 6 mm). Size CD140AG11R; CD140AFR – Incl. roughness option. Optional extras: PC, probe elements No. 499314 – 499318. Note: Commissioning and training available on request. 49 Only available in Germany and Austria! 49 9299 Probe system with magnetic contact point holder and a probe arm length of 350 mm makes it possible to change the probe tips quickly without using tools – without recalibration. The automatic contact force selection guarantees the correct contact force when changing several probe tips. 49 9301 Type CD140AF CD140AFR CD140AG11 CD140AG11R CD contour measuring station 49 9299 40W – – – – 140AF CD contour measuring station 49 9301 40W – – – – 140AG11 Traverse path X mm 140 Measuring range Z mm 70 Guide deviation Z µm 1 (over 140 mm) Gauging force mN 4 – 30 Measuring speed X mm/s 0.1 – 10 Positioning speed in X mm/s 1 – 200 Contact point length mm 350 Resolution nm 19 Height mm 426 426 905 905 Width mm 836 836 822 822 Depth mm 385 385 572 572 281