
| In combination with Nikon's new image processing technology, the | Easy selection of desired edges by eliminating dust |
| VMA-2520 provides state-of-the art image processing. The digital | and burrs |
| video image outputs are transferred to a PC's IEEE1394 port via | |
| the controller and processed for sub-pixel level edge detection. | Some workpieces contain multiple edges within a given caliper, or |
| This eliminates the need for a frame grabber in the host computer | their contrast is too low, making edge detection extremely difficult. |
| and enables high-speed, highly-accurate observations and | This function graphically profiles the contrasts of the image within |
| measurements. The 3CCD progressive scan color camera also | the caliper using a multi-gray-level scale, enabling the operator to |
| achieves FOV measurement repeatability equivalent to that of a | select any one of a number of edges. Selection of the desired edge |
| monochrome camera. | is simple: click the appropriate buttons in the edge selection menu |
and adjust the threshold level using the mouse.
When the operator clicks the point to be measured, the system automatically rotates the probes, sets them at the optimum position, and sets the probe size, all automatically.
Dust clearly removed by the Edge selection graphic window projection probe
Drag to resize and fit the projection probe After this process to the edge
Finding a skewed part location and correcting positional deviations of the edge probing points within a part are programmable by a pattern-matching feature, eliminating possible measurement errors.
Thanks to this function, the operator no longer needs to manually place multiple workpieces in proper alignment; the iNEXIV automatically searches workpiece location and its orientation.
Automatically corrects deviations between the edge probing points programmed in a teaching file as well as irregular feature positions without edge probing error.
Normal pin location
Search on left-side mark Search on right-side mark
Pattern matched on Circle probe appears on the abnormal pin abnormal pin location location without measurement failure Before APS After APS